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Prerequisites
Taught by
Language of instruction
Duration
Identical courses
Cannot be taken as part of an examination contractAims
- Optical microscopy, Electron microscopy (mainly SEM and introduction to TEM), Ion miroscopy and Diffraction techniques such as X-ray Diffraction, Neutron diffraction and electron diffraction, Scanning probe microscopy (STM and AFM)
Previous knowledge
Basic knowlegde in physics and chemistry as well as solid background in physical and chemical materials science is required.
Order of Enrolment
This course unit is a prerequisite for taking the following course units:
H00B3C : Project Work and Problem Solving Linked to the Core Courses: Part II
Is included in these courses of study
- Master in de nanowetenschappen, nanotechnologie en nano-engineering (Leuven) 120 ects.
- Master in de nanowetenschappen, nanotechnologie en nano-engineering (Leuven) (Optie nanomaterialen en nanochemie) 120 ects.
- Master in de nanowetenschappen, nanotechnologie en nano-engineering (programma voor industrieel ingenieurs of master industriële wetenschappen - aanverwante richting) (Leuven) (Optie nanomaterialen en nanochemie) 120 ects.
- Master of Nanoscience, Nanotechnology and Nanoengineering (Leuven) 120 ects.
- Master of Nanoscience, Nanotechnology and Nanoengineering (Leuven) (Option: Nanomaterials and Nanochemistry) 120 ects.
- Courses for Exchange Students Faculty of Engineering Science (Leuven)
- Erasmus Mundus Master of Science in Nanoscience and Nanotechnology (Leuven et al) 120 ects.
Activities
2.4 ects. Materials Characterization Techniques I: Microscopy and Diffraction: Lecture (B-KUL-H09W7a)
Content
Optical microscopy, Electron microscopy (mainly SEM and introduction to TEM), Ion miroscopy and Diffraction techniques such as X-ray diffraction, Neutron diffraction and electron diffraction, scanning probe microscopy (STM and AFM)
Course material
Slides and additional reading made available on Toledo, each lecture will be recorded, and recordings will be available on Toledo.
Microstructural Characterization of Materials, D. Brandon and W.D. Kaplan, Wiley & Sons
Physical Methods for Materials Characterization, P.E.J. Flewitt and R.K. Wild, Institute of Physics Publishing
Physical Principles of Electron Microscopy, R.F. Egerton, Springer Verlag
Format: more information
Traditional lecture
The theoretical and pratical aspects of the microscopy and diffraction techniques are lectured. Firstly, the basics of the microscopy and diffraction are explained. Subsequently, the principle of the techniques is discussed together with the technical layout, the potential and limites of the techniques. Active participation of students in the discussion is highly desired.
Is also included in other courses
0.6 ects. Materials Characterization Techniques I: Microscopy and Diffraction: Exercises (B-KUL-H09W8a)
Content
Demo session will be organized to show a scanning electron microscope in operation. SEM equipped with an EDS detector and EBSD will be presented together with a focused ion beam.
Exercise sessions will be given for interpretation of x-ray diffraction (XRD) data.
Course material
Microstructural Characterization of Materials, D. Brandon and W.D. Kaplan, Wiley & Sons
Physical Methods for Materials Characterization, P.E.J. Flewitt and R.K. Wild, Institute of Physics Publishing
Format: more information
Laboratory visit - Practice session
In small groups students will see a SEM and focused-ion beam (FIB) in operation. It will be demonstrated how these techniques are used for materials characterization in real life.
For x-ray diffraction (XRD), after a short repetition of the theoretical background the students will work out in small groups an assignment. This involved analysis of a XRD pattern to be indexed and interpreted.
Is also included in other courses
Evaluation
Evaluation: Materials Characterization Techniques I: Microscopy and Diffraction (B-KUL-H21J4c)
Explanation
Oral exam with written preparation for about one hour. During the first one hour of the exam, it will be possible to use the slides. The slides may contain markings and comments (but not more than some paragraphs, not full pages of written or printed notes).
Information about retaking exams
Same exam type as the initial exam.