Required in stage
Optional in stage
Second term
Both terms
Not organised
This year
Next year
Alternating years
Prerequisites
Identical coursesAdvanced Characterization Techniques for Nanostructures (B-KUL-H0Q19A)
English
First term
Cannot be taken as part of an examination contractCannot be taken as part of a credit contract
N. 
Université Grenoble AlpesAims
This course will be dedicated to advanced characterization techniques of nanostructures. It will cover electron microscopy techniques (electron diffraction, loss spectroscopy, imaging), X ray spectroscopy and scattering techniques and Synchrotron radiation measurements.
Previous knowledge
General concepts in physics, solid state physics and material science.
Is included in these courses of study
Activities
3 ects. Advanced Characterization Techniques for Nanostructures (B-KUL-H0Q19a)
EnglishFormat: Lecture-practicalFirst termN. Content
X-ray scattering (from single electron to periodic material, anomalous scattering)
Reciprocal space (reminder +
Surface sensitive X-ray scattering
X-ray absorption fine structure
Examples of application : strain and composition determination, in situ studies of growth
Introduction to the X-ray synchrotron radiation production (including the forth generation source like the ESRF Extremely Brilliant Source)
Coherent X-ray scattering and X-ray photon correlation spectroscopy
The basis of electron microscopy
Electron diffraction and Electron loss Spectroscopy
Imaging and chemical sensitivity (Transmission Electron Microscopy and Scanning Transmission Electron Microscopy)
Case studies
Course material
- Text book
- Articles and literature
- Slides