Required in stage
First term
Both terms
Not organised
This year
Next year
Alternating years
External
Prerequisites
Identical coursesScanning Probe Microscopy (B-KUL-H06E8A)
Cannot be taken as part of an examination contract
N. | Van de Vondel Joris (substitute) Aims
Starting from practical applications and demo’s the students will acquire a deeper knowledge on the physical principles that underly the various forms of scanning probe microscopy. Moreover, the students will get insights into the possibilities as well as the limitations to scan surfaces with nanometer resolution, and to transform the obtained physical information into digital pictures. Finally, the students acquire the needed background to critically assess novel scanning probe methods used in contemporary nanoscience research.
Previous knowledge
The student has sufficient general knowledge of physics and quantum physics. In addition the student has a basic knowledge of chemistry and the chemical bond.
(Ma Nanoscience: Necessary basis to disciplines as offered in the introductory courses H06E2A Quantum physics; H06O1A Atoomtheorie, chemische periodiciteit en chemische binding)
Is included in these courses of study
- Courses for Exchange Students Faculty of Science (Leuven)
- Master in de nanowetenschappen, nanotechnologie en nano-engineering (Leuven) 120 ects.
- Master of Nanoscience, Nanotechnology and Nanoengineering (Leuven) 120 ects.
- Courses for Exchange Students Faculty of Engineering Science (Leuven)
- Master of Physics (Leuven) 120 ects.
- Erasmus Mundus Master of Science in Nanoscience and Nanotechnology (Leuven et al) 120 ects.
- Master of Chemistry (Leuven) 120 ects.
Activities
2 ects. Scanning Probe Microscopy (B-KUL-H06E8a)
EnglishFormat: Lecture
18 
Second termN. | Van de Vondel Joris (substitute) Content
-Historical introduction to scanning probe microscopy.
-Introduction to the basic principles of scanning tunneling microscopy (STM) and tunneling spectroscopy.
-Study of various physical properties using STM.
· Surface reconstruction and growth of thin films
· Individual doping centers in semiconductors
· Electronic, magnetic and superconducting properties of different materials
-Introduction to the basic principles of atomic force microscopy (AFM), and of local force spectroscopy.
-Study of physical properties with force microscopy.
· -Sensing atoms, detection of individual chemical bonds
· -Determination of local mechanical properties
· -Thermal microscopy
· -Electric Force Microscopy (EFM)
-Introduction to scanning probe microscopy based on magnetic interactions.
· -Magnetic force microscopy (MFM)
· -Force microscopy using local magnetic resonance (MRFM)
· -Scanning Hall probe microscopy (SHPM)
-Introduction, by the students, of a particular set of novel scanning probe technique and or methods.
Course material
Copies of PowerPoint presentations (available via Toledo)
Copies of relevant articles (available via Toledo)
1 ects. Scanning Probe Microscopy: Exercises and Labs (B-KUL-H06E9a)
EnglishFormat: Practical10 Second termN. | Van de Vondel Joris (substitute) Content
-Practical demonstration of scanning tunneling microscopy and atomic force microscopy.
-Lab visit to show real examples of the techniques discussed during the classes.
-Students will get a final assignment, in a team, in which they perform an in-depth investigation of a recent scanning probe technique and present it in class.
Course material
Copies of PowerPoint presentations (available via Toledo)
Copies of relevant articles (available via Toledo)